Sandeep R. Bahl

According to our database, Sandeep R. Bahl authored at least 3 papers between 2019 and 2024.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2024

Mission Profile Approach for the Calculation of GaN FET Reliability in Power Supply Applications (Invited).

Sandeep R. Bahl, Jungwoo Joh, Fei Yang

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2020

A Generalized Approach to Determine the Switching Lifetime of a GaN FET.

Sandeep R. Bahl, Francisco Baltazar, Yong Xie

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

A New Approach to Validate GaN FET Reliability to Power-Line Surges Under Use-Conditions.

Sandeep R. Bahl, Paul Brohlin

Proceedings of the IEEE International Reliability Physics Symposium, 2019