Samvel K. Shoukourian

According to our database, Samvel K. Shoukourian authored at least 36 papers between 1995 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Analytics for AI Related Applications of Multidimensional Multitape Finite Automata.

Samvel K. Shoukourian, Tigran Grigoryan, Sevak Amirkhanyan

Proceedings of the Electronics, Communications and Networks, 2023

2021

Some Results on Regular Events for Multitape Finite Automata: A Preliminary Report.

Alexander Godlevsky, Hayk A. Grigoryan, Tigran Grigoryan, Samvel K. Shoukourian

Bull. EATCS, 2021

2020

Memory Physical Aware Multi-Level Fault Diagnosis Flow.

Gurgen Harutyunyan, Suren Martirosyan, Samvel K. Shoukourian, Yervant Zorian

IEEE Trans. Emerg. Top. Comput., 2020

Polynomial algorithm for equivalence problem of deterministic multitape finite automata.

Hayk A. Grigoryan, Samvel K. Shoukourian

Theor. Comput. Sci., 2020

2019

Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism.

Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

Innovative Practices on In-System Test and Reliability of Memories.

S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Armenia: Communicating to World Community in Electronic Test and Design.

Samvel K. Shoukourian, Yuri Shoukourian, Vladimir Sahakyan

Proceedings of the IEEE International Test Conference, 2019

Memory FIT Rate Mitigation Technique for Automotive SoCs.

Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2019

2018

Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs.

Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides

Proceedings of the IEEE International Test Conference, 2018

2017

Experimental study on Hamming and Hsiao codes in the context of embedded applications.

Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

Automated flow for test pattern creation for IPs in SoC.

D. Sargsyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

An efficient testing methodology for embedded flash memories.

Suren Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

2016

Securing test infrastructure of system-on-chips.

Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

2015

Overview study on fault modeling and test methodology development for FinFET-based memories.

Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

An efficient approach for memory repair by reducing the number of spares.

Vrezh Sargsyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Avetik Yessayan

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

A power based memory BIST grouping methodology.

L. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

2014

Extending fault periodicity table for testing faults in memories under 20nm.

Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the 2014 East-West Design & Test Symposium, 2014

2013

An effective solution for building memory BIST infrastructure based on fault periodicity.

Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters.

T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the East-West Design & Test Symposium, 2013

Impact of process variations on read failures in SRAMs.

Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the East-West Design & Test Symposium, 2013

Application of defect injection flow for fault validation in memories.

K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the East-West Design & Test Symposium, 2013

2012

A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs.

Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

2011

Symmetry Measure for Memory Test and Its Application in BIST Optimization.

Gurgen Harutunyan, Aram Hakhumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

J. Electron. Test., 2011

Generic BIST architecture for testing of content addressable memories.

Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

A Robust Solution for Embedded Memory Test and Repair.

K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

The Equivalence Problem of Deterministic Multitape Finite Automata: A New Proof of Solvability Using a Multidimensional Tape.

Alexander A. Letichevsky, Arsen S. Shoukourian, Samvel K. Shoukourian

Proceedings of the Language and Automata Theory and Applications, 2010

2009

An approach for formal verification of business processes.

Armen Kostanyan, Vardan Matevosyan, Samvel K. Shoukourian, Anna Varosyan

Proceedings of the 2009 Spring Simulation Multiconference, SpringSim 2009, 2009

2008

The equivalence problem of multidimensional multitape automata.

Haik Grigorian, Samvel K. Shoukourian

J. Comput. Syst. Sci., 2008

2006

Alternative Combination of Processes.

Levon Hayrapetyan, Samvel K. Shoukourian

Proceedings of the International Conference on Parallel and Distributed Processing Techniques and Applications & Conference on Real-Time Computing Systems and Applications, 2006

2004

SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure.

Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

IEEE Des. Test Comput., 2004

A Methodology for Design and Evaluation of Redundancy Allocation Algorithms.

Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

2003

Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield.

Yervant Zorian, Samvel K. Shoukourian

IEEE Des. Test Comput., 2003

2001

An Approach for Evaluation of Redunancy Analysis Algorithms.

Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the 9th IEEE International Workshop on Memory Technology, 2001

1999

An Approach for Access Differentiation Design in Medical Distributed Applications Built on Databases.

Samvel K. Shoukourian, A. M. Vasilyan, A. A. Avagyan, A. K. Shukurian

Proceedings of the Medical Informatics Europe '99, Proceedings, Ljubljana, Slovenia, 1999

1998

A Unified Design Methodology for Offline and Online Testing.

Samvel K. Shoukourian

IEEE Des. Test Comput., 1998

1995

An approach for system tests design and its application.

Samvel K. Shoukourian, Armen G. Kostanian, Valery A. Margarian, Ayman A. Ashour

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995