Samuel Nascimento Pagliarini
Orcid: 0000-0002-5294-0606
According to our database1,
Samuel Nascimento Pagliarini
authored at least 80 papers
between 2011 and 2024.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
-
on orcid.org
On csauthors.net:
Bibliography
2024
ACM Comput. Surv., December, 2024
High-Speed Design of Post Quantum Cryptography With Optimized Hashing and Multiplication.
IEEE Trans. Circuits Syst. II Express Briefs, February, 2024
Trojan Insertion versus Layout Defenses for Modern ICs: Red-versus-Blue Teaming in a Competitive Community Effort.
IACR Cryptol. ePrint Arch., 2024
CoRR, 2024
CoRR, 2024
SCARF: Securing Chips with a Robust Framework against Fabrication-time Hardware Trojans.
CoRR, 2024
CAC 2.0: A Corrupt and Correct Logic Locking Technique Resilient to Structural Analysis Attacks.
Proceedings of the 25th IEEE Latin American Test Symposium, 2024
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024
Proceedings of the 29th Asia and South Pacific Design Automation Conference, 2024
REPQC: Reverse Engineering and Backdooring Hardware Accelerators for Post-quantum Cryptography.
Proceedings of the 19th ACM Asia Conference on Computer and Communications Security, 2024
2023
J. Cryptogr. Eng., November, 2023
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023
J. Hardw. Syst. Secur., September, 2023
Hardware Trojan Insertion in Finalized Layouts: From Methodology to a Silicon Demonstration.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., July, 2023
IEEE Trans. Very Large Scale Integr. Syst., June, 2023
IEEE Trans. Circuits Syst. I Regul. Pap., February, 2023
IACR Cryptol. ePrint Arch., 2023
Proceedings of the 24th International Symposium on Quality Electronic Design, 2023
Proceedings of the 2023 International Symposium on Physical Design, 2023
2022
IEEE Trans. Circuits Syst. II Express Briefs, 2022
CoRR, 2022
IEEE Access, 2022
Proceedings of the Embedded Computer Systems: Architectures, Modeling, and Simulation, 2022
Proceedings of the 23rd International Symposium on Quality Electronic Design, 2022
Proceedings of the 23rd International Symposium on Quality Electronic Design, 2022
Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, 2022
Proceedings of the 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2022
Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022
Proceedings of the 2022 Workshop on Attacks and Solutions in Hardware Security, 2022
A Side-Channel Hardware Trojan in 65nm CMOS with 2μW precision and Multi-bit Leakage Capability.
Proceedings of the 27th Asia and South Pacific Design Automation Conference, 2022
2021
Proceedings of the 22nd IEEE Latin American Test Symposium, 2021
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2021
Proceedings of the IEEE International Symposium on Circuits and Systems, 2021
Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021
Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021
Proceedings of the 30th IEEE Asian Test Symposium, 2021
Proceedings of the Asian Hardware Oriented Security and Trust Symposium, 2021
2020
IEEE Trans. Very Large Scale Integr. Syst., 2020
IEEE Trans. Neural Networks Learn. Syst., 2020
From Virtual Characterization to Test-Chips: DFM Analysis Through Pattern Enumeration.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
IACR Cryptol. ePrint Arch., 2020
A Systematic Study of Lattice-based NIST PQC Algorithms: from Reference Implementations to Hardware Accelerators.
CoRR, 2020
IEEE Access, 2020
Proceedings of the 2020 IEEE International Symposium on Hardware Oriented Security and Trust, 2020
Proceedings of the IEEE European Test Symposium, 2020
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020
2019
J. Hardw. Syst. Secur., 2019
2018
IEEE Trans. Very Large Scale Integr. Syst., 2018
Proceedings of the 2018 IEEE International Conference on Rebooting Computing, 2018
2017
Improved Multiple Faults-Aware Placement Strategy: Reducing the Overheads and Error Rates in Digital Circuits.
IEEE Trans. Reliab., 2017
A Flexible Online Checking Technique to Enhance Hardware Trojan Horse Detectability by Reliability Analysis.
IEEE Trans. Emerg. Top. Comput., 2017
A self-calibrating sense amplifier for a true random number generator using hybrid FinFET-straintronic MTJ.
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2017
Proceedings of the 18th International Symposium on Quality Electronic Design, 2017
Proceedings of the 18th International Symposium on Quality Electronic Design, 2017
2014
Design and Analysis of Binary Tree Static Random Access Memory for Low Power Embedded Systems.
J. Low Power Electron., 2014
A placement strategy for reducing the effects of multiple faults in digital circuits.
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014
A hybrid reliability assessment method and its support of sequential logic modelling.
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014
Proceedings of the Reconfigurable Computing: Architectures, Tools, and Applications, 2014
2013
SNaP: A novel hybrid method for circuit reliability assessment under multiple faults.
Microelectron. Reliab., 2013
Microelectron. Reliab., 2013
Selective hardening against multiple faults employing a net-based reliability analysis.
Proceedings of the IEEE 11th International New Circuits and Systems Conference, 2013
Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis.
Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013
Single event transient mitigation through pulse quenching: Effectiveness at circuit level.
Proceedings of the 20th IEEE International Conference on Electronics, 2013
2012
Microelectron. Reliab., 2012
Proceedings of the 13th Latin American Test Workshop, 2012
Automatic selective hardening against soft errors: A cost-based and regularity-aware approach.
Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012
2011
J. Electron. Test., 2011
Using dynamic partial reconfiguration to detect sees in microprocessors through non-intrusive hybrid technique.
Proceedings of the 24th Symposium on Integrated Circuits and Systems Design, 2011
Proceedings of the 2011 IEEE International Conference on Microelectronic Systems Education, 2011
Proceedings of the 12th Latin American Test Workshop, 2011