Samiha Mourad

According to our database, Samiha Mourad authored at least 41 papers between 1980 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2012

A low-cost configurability test strategy for an embedded analog circuit.

Agustin Laprovitta, Gabriela Peretti, Eduardo Romero, Samiha Mourad

Microelectron. J., 2012

2010

Partial-Matching Technique in a Mixed-Mode BIST Environment.

Taweesak Reungpeerakul, Douglas Kay, Samiha Mourad

IEEE Trans. Instrum. Meas., 2010

Digital Logic Implementation in Memristor-Based Crossbars - A Tutorial.

Tezaswi Raja, Samiha Mourad

Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

2008

Wave Pipelining Using Self Reset Logic.

Miguel Eduardo Litvin, Samiha Mourad

VLSI Design, 2008

2006

Crosstalk Induced Fault Analysis and Test in DRAMs.

Zemo Yang, Samiha Mourad

J. Electron. Test., 2006

Wave Pipelining using Self Reset Logic.

Miguel Eduardo Litvin, Samiha Mourad, William Terry, Janice Terry

Proceedings of the 13th IEEE International Conference on Electronics, 2006

BCH-based Compactors of Test Responses with Controllable Masks.

Taweesak Reungpeerakul, Xiaoshu Qian, Samiha Mourad

Proceedings of the 15th Asian Test Symposium, 2006

2005

Self-reset logic for fast arithmetic applications.

Miguel Eduardo Litvin, Samiha Mourad

IEEE Trans. Very Large Scale Integr. Syst., 2005

Design-for-testability for embedded delay-locked loops.

Tom Egan, Samiha Mourad

IEEE Trans. Very Large Scale Integr. Syst., 2005

Embedded test control schemes using iBIST for SOCs.

Douglas Kay, Sung Chung, Samiha Mourad

IEEE Trans. Instrum. Meas., 2005

2004

On-chip rise-time measurement.

San L. Lin, Samiha Mourad

IEEE Trans. Instrum. Meas., 2004

Crosstalk induced fault analysis in DRAMs.

Zemo Yang, Samiha Mourad

Proceedings of the Proceedings 2004 IEEE International SOC Conference, 2004

2003

A self-binning BIST structure for data communications transceivers.

San L. Lin, Shoba Krishnan, Samiha Mourad

IEEE Trans. Instrum. Meas., 2003

2002

A framework for the characterization and verification of embedded phase-locked loops.

Thomas Egan, Samiha Mourad

IEEE Trans. Instrum. Meas., 2002

Partial Scan Testing on the Register-Transfer Level.

Bruce S. Greene, Samiha Mourad

J. Electron. Test., 2002

Embedded testing for data communications circuits.

San Lin, Samiha Mourad

Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002

A new model for metastability.

Mary Sue Haydt, Samiha Mourad, William Terry, Janice Terry

Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002

Embedded test control schemes for compression in SOCs.

Douglas Kay, Sung Chung, Samiha Mourad

Proceedings of the 39th Design Automation Conference, 2002

2001

Effect of Reverse Body Bias on Current Testing of 0.18 μm Gates.

Xiaomei Liu, Prachi Sathe, Samiha Mourad

VLSI Design, 2001

Compression Technique for Interactive BIST Application.

Douglas Kay, Samiha Mourad

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Verification of Embedded Phase-Locked Loops.

Tom Egan, Samiha Mourad

Proceedings of the 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 2001

At-speed testing of data communications transceivers.

San Lin, Samiha Mourad, Shoba Krishnan

Proceedings of the 2001 International Symposium on Circuits and Systems, 2001

2000

Crosstalk in Deep Submicron DRAMs.

Zemo Yang, Samiha Mourad

Proceedings of the 8th IEEE International Workshop on Memory Technology, 2000

Performance of submicron CMOS devices and gates with substrate biasing.

Xiaomei Liu, Samiha Mourad

Proceedings of the IEEE International Symposium on Circuits and Systems, 2000

1999

Scan-path based testing of systems on a chip.

Samiha Mourad, Bruce S. Greene

Proceedings of the 6th IEEE International Conference on Electronics, Circuits and Systems, 1999

1996

Digital design with minimal number of scan flip-flops.

Samiha Mourad

Proceedings of Third International Conference on Electronics, Circuits, and Systems, 1996

1994

Gate-to-channel shorts in BiCMOS logic gates.

C.-J. Chen, Samiha Mourad

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

Modeling the Effect of Ground Bounce on Noise Margin.

Mary Sue Haydt, Robert Owens, Samiha Mourad

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

Optimal Logic Blocks for FPGAs, using Factorial Design Techniques.

Faisal Haq, Samiha Mourad

Proceedings of the Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1994

1993

Computer-Aided Testing Systems: Evaluation and Benchmark Circuits.

Samiha Mourad

VLSI Design, 1993

1992

Benchmarking Array Comparators.

Samiha Mourad

Proceedings of the Fifth International Conference on VLSI Design, 1992

1990

Sequential circuit testing.

Samiha Mourad

Proceedings of the Intellectual Leverage: Thirty-Fifth IEEE Computer Society International Conference, 1990

1988

Probability models for pseudorandom test sequences.

Edward J. McCluskey, Samy Makar, Samiha Mourad, Kenneth D. Wagner

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988

On Benchmarking Digital Testing Systems.

Samiha Mourad, Edward J. McCluskey

Proceedings of the Proceedings International Test Conference 1988, 1988

Digital Testing, Theory and Practice.

Samiha Mourad

Proceedings of the Proceedings International Test Conference 1988, 1988

Multiple stuck-at fault testability of self-testing checkers.

Takashi Nanya, Samiha Mourad, Edward J. McCluskey

Proceedings of the Eighteenth International Symposium on Fault-Tolerant Computing, 1988

1987

On the Reliability of the IBM MVS/XA Operating.

Samiha Mourad, Dorothy Andrews

IEEE Trans. Software Eng., 1987

1986

Stuck-At Fault Detection in Parity Trees.

Samiha Mourad, Joseph L. A. Hughes, Edward J. McCluskey

Proceedings of the Fall Joint Computer Conference, November 2-6, 1986, Dallas, Texas, USA, 1986

Multiple Fault Detection in Parity Trees.

Samiha Mourad, Joseph L. A. Hughes, Edward J. McCluskey

Proceedings of the Spring COMPCON'86, 1986

1985

An Experimental Study Comparing 74LS181 Test Sets.

Joseph L. A. Hughes, Samiha Mourad, Edward J. McCluskey

Proceedings of the Spring COMPCON'85, 1985

1980

An optimized ATPG.

Samiha Mourad

Proceedings of the 17th Design Automation Conference, 1980