Sameer Chillarige

According to our database, Sameer Chillarige authored at least 8 papers between 2015 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Low cost production scan chain test for compression based designs.

Bharath Nandakumar, Sameer Chillarige

Proceedings of the IEEE International Test Conference, 2023

2022

Scaling physically aware logic diagnosis to complex high volume 7nm server processors.

Bharath Nandakumar, Madhur Maheshwari, Sameer Chillarige, Robert Redburn, Jeff Zimmerman, Nicholai L'Esperance, Edward Dziarcak

Proceedings of the IEEE International Test Conference, 2022

PPA Optimization of Test Points in Automotive Designs.

Brian Foutz, Sarthak Singhal, Prateek Kumar Rai, Krishna Chakravadhanula, Vivek Chickermane, Bharath Nandakumar, Sameer Chillarige, Christos Papameletis, Satish Ravichandran

Proceedings of the IEEE International Test Conference, 2022

2021

Diagnosis and Yield Learning.

Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Sameer Chillarige

Proceedings of the IEEE International Test Conference in Asia, 2021

2020

Improved Chain Diagnosis Methodology for Clock and Control Signal Defect Identification.

Bharath Nandakumar, Sameer Chillarige, Anil Malik, Atul Chabbra, Nicholai L'Esperance, Robert Redburn

Proceedings of the IEEE International Test Conference, 2020

2018

Improving Diagnosis Resolution and Performance at High Compression Ratios.

Sameer Chillarige, Atul Chhabra, Anil Malik, Bharath Nandakumar, Joe Swenton, Krishna Chakravadhanula

Proceedings of the IEEE International Test Conference, 2018

2017

High throughput multiple device diagnosis system.

Sameer Chillarige, Anil Malik, Sharjinder Singh, Joe Swenton, Krishna Chakravadhanula

Proceedings of the IEEE International Test Conference, 2017

2015

A Novel Failure Diagnosis Approach for Low Pin Count and Low Power Compression Architectures.

Sameer Chillarige, S. Virdi, Anil Malik, Krishna Chakravadhanula, Vivek Chickermane, Joe Swenton, G. Vandling

Proceedings of the 24th IEEE North Atlantic Test Workshop, 2015