Salvador Hidalgo

Orcid: 0000-0002-8070-3499

According to our database1, Salvador Hidalgo authored at least 17 papers between 2003 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

Online presence:

On csauthors.net:

Bibliography

2023
Inverse LGAD (iLGAD) Periphery Optimization for Surface Damage Irradiation.
Sensors, April, 2023

2022
Study of Ionization Charge Density-Induced Gain Suppression in LGADs.
Sensors, 2022

2018
Large-Area Automated Layout Extraction Methodology for Full-IC Reverse Engineering.
J. Hardw. Syst. Secur., 2018

2016
A Verilog-A model of a silicon resistive strip for particle detectors.
Proceedings of the 13th International Conference on Synthesis, 2016

2014
3.3 kV PT-IGBT with voltage-sensor monolithically integrated.
IET Circuits Devices Syst., 2014

The use of digital image processing for IC reverse engineering.
Proceedings of the IEEE 11th International Multi-Conference on Systems, Signals & Devices, 2014

2012
Simulation methodology for dose effects in lateral DMOS transistors.
Microelectron. J., 2012

2011
Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions.
IEEE Trans. Ind. Electron., 2011

2008
IGBT module failure analysis in railway applications.
Microelectron. Reliab., 2008

Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors.
Microelectron. Reliab., 2008

Superjunction LDMOS on thick-SOI technology for RF applications.
Microelectron. J., 2008

2005
Lateral punch-through TVS devices for on-chip protection in low-voltage applications.
Microelectron. Reliab., 2005

Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile.
Microelectron. Reliab., 2005

2004
Design considerations for 6.5 kV IGBT devices.
Microelectron. J., 2004

Thin-film silicon-on-sapphire LDMOS structures for RF power amplifier applications.
Microelectron. J., 2004

2003
Passivation and packaging of positive bevelled edge termination and related electrical stability.
Microelectron. Reliab., 2003

Optimisation of very low voltage TVS protection devices.
Microelectron. J., 2003


  Loading...