Salvador Dueñas

Orcid: 0000-0002-2328-1752

According to our database1, Salvador Dueñas authored at least 5 papers between 2005 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2022
Empirical Modelling of ReRAM Measured Characteristics Using Charge and Flux.
Proceedings of the 11th International Conference on Modern Circuits and Systems Technologies, 2022

2014
Single-parameter model for the post-breakdown conduction characteristics of HoTiO<sub>x</sub>-based MIM capacitors.
Microelectron. Reliab., 2014

2007
Experimental observations of temperature-dependent flat band voltage transients on high-k dielectrics.
Microelectron. Reliab., 2007

2005
Electrical characterization of hafnium oxide and hafnium-rich silicate films grown by atomic layer deposition.
Microelectron. Reliab., 2005

On the influence of substrate cleaning method and rapid thermal annealing conditions on the electrical characteristics of Al/SiN<sub>x</sub>/SiO<sub>2</sub>/Si fabricated by ECR-CVD.
Microelectron. Reliab., 2005


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