Salvador Bracho

According to our database1, Salvador Bracho authored at least 21 papers between 1990 and 2014.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2014
Modeling of faulty implantable MEMS pressure sensors.
Proceedings of the 26th International Conference on Microelectronics, 2014

2013
Behavioral model of folded and interpolated ADCs for test evaluation - Case study: Structural DfT method.
Microelectron. J., 2013

2011
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor.
J. Electron. Test., 2011

Design-for-Test method for high-speed ADCs: Behavioral description and optimization.
Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

2010
Test Based on Built-In Current Sensors for Mixed-Signal Circuits.
Proceedings of the Emerging Trends in Technological Innovation, 2010

Structural DfT Strategy for High-Speed ADCs.
Proceedings of the Emerging Trends in Technological Innovation, 2010

Test of embedded analog circuits based on a built-in current sensor.
Proceedings of the 15th European Test Symposium, 2010

2007
Structural DfT Approach on Folded ADCs.
Proceedings of the 14th IEEE International Conference on Electronics, 2007

2005
Power-mode-controlled power-factor corrector for electronic ballast.
IEEE Trans. Ind. Electron., 2005

Test of a switched-capacitor ADC by a built-in charge sensor.
Microelectron. J., 2005

Fault Detection in Switched Current Circuits Using Built-in Transient Current Sensors.
J. Electron. Test., 2005

Design of a Microelectronic Circuits Course Using Interactive Methods.
Proceedings of the 2005 International Conference on Microelectronics Systems Education, 2005

2004
Study of output power variation due to component tolerances in LC<sub>s</sub>C<sub>p</sub> resonant inverters applied to HPS lamp control.
IEEE Trans. Ind. Electron., 2004

2002
Hard-to-Detect Faults by Dinamic Current Sensor in Analogue Circuits.
Proceedings of the 3rd Latin American Test Workshop, 2002

Built-In Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal Ics.
Proceedings of the 2002 Design, 2002

2001
On Line IC Test Course With Distance Access to Test Equipment.
Proceedings of the 2nd Latin American Test Workshop, 2001

2000
Contributions to the design and control of LC<sub>s</sub>C<sub>p </sub> resonant inverters to drive high-power HPS lamps.
IEEE Trans. Ind. Electron., 2000

1999
A Method for Designing a Deterministic Test Pattern Generator Based on Cellular Automata.
J. Electron. Test., 1999

1996
Signature analysis for fault detection of mixed-signal ICs based on dynamic power-supply current.
J. Electron. Test., 1996

1995
Iddt testing of continuous-time filters.
Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

1990
Arithmetical logical unit design for a processor with BILBO techniques: Functional simulation and test strategies.
Microprocessing and Microprogramming, 1990


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