Sagar S. Sabade

According to our database, Sagar S. Sabade authored at least 14 papers between 2001 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

Estimation of fault-free leakage current using wafer-level spatial information.

Sagar S. Sabade, D. M. H. Walker

IEEE Trans. Very Large Scale Integr. Syst., 2006

2005

IC Outlier Identification Using Multiple Test Metrics.

Sagar S. Sabade, Duncan M. Hank Walker

IEEE Des. Test Comput., 2005

2004

I_DDX-based test methods: A survey.

Sagar S. Sabade, D. M. H. Walker

ACM Trans. Design Autom. Electr. Syst., 2004

I_DDQ data analysis using neighbor current ratios.

Sagar S. Sabade, D. M. H. Walker

J. Syst. Archit., 2004

On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set.

Sagar S. Sabade, D. M. H. Walker

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests.

Sagar S. Sabade, D. M. H. Walker

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

2003

Use of Multiple IDDQ Test Metrics for Outlier Identification.

Sagar S. Sabade, D. M. H. Walker

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification.

Sagar S. Sabade, D. M. H. Walker

Proceedings of the 16th International Conference on VLSI Design (VLSI Design 2003), 2003

CROWNE: Current Ratio Outliers with Neighbor Estimator.

Sagar S. Sabade, D. M. H. Walker

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

2002

IDDQ Test: Will It Survive the DSM Challenge?

Sagar S. Sabade, D. M. H. Walker

IEEE Des. Test Comput., 2002

Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction.

Sagar S. Sabade, D. M. H. Walker

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Evaluation of Statistical Outlier Rejection Methods for IDDQ Limit Setting.

Sagar S. Sabade, D. M. H. Walker

Proceedings of the 7th Asia and South Pacific Design Automation Conference (ASP-DAC 2002), 2002

Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis.

Sagar S. Sabade, D. M. H. Walker

Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002

2001

Improved wafer-level spatial analysis for I_DDQ limit setting.

Sagar S. Sabade, D. M. H. Walker

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001