Sachin Dileep Dasnurkar

According to our database, Sachin Dileep Dasnurkar authored at least 6 papers between 2009 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2013

Experiments and analysis to characterize logic state retention limitations in 28nm process node.

Sachin Dileep Dasnurkar, Animesh Datta, Mohamed H. Abu-Rahma, Hieu Nguyen, Martin Villafana, Hadi Rasouli, Sean Tamjidi, Ming Cai, Samit Sengupta, P. R. Chidambaram, Raghavan Thirumala, Nikhil Kulkarni, Prasanna Seeram, Prasad Bhadri, Prayag Patel, Sei Seung Yoon, Esin Terzioglu

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology.

Animesh Datta, Mohamed H. Abu-Rahma, Sachin Dileep Dasnurkar, Hadi Rasouli, Sean Tamjidi, Ming Cai, Samit Sengupta, P. R. Chidambaram, Raghavan Thirumala, Nikhil Kulkarni, Prasanna Seeram, Prasad Bhadri, Prayag Patel, Sei Seung Yoon, Esin Terzioglu

Proceedings of the International Symposium on Quality Electronic Design, 2013

2012

Calibration Enabled Scalable Current Sensor Module for Quiescent Current Testing.

Sachin Dileep Dasnurkar, Jacob A. Abraham

J. Electron. Test., 2012

2010

Real-time dynamic hybrid BiST solution for Very-Low-Cost ATE production testing of A/D converters with controlled DPPM.

Sachin Dileep Dasnurkar, Jacob A. Abraham

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

Calibration-enabled scalable built-in current sensor compatible with very low cost ATE.

Sachin Dileep Dasnurkar, Jacob A. Abraham

Proceedings of the 15th European Test Symposium, 2010

2009

Hybrid BiST Solution for Analog to Digital Converters with Low-cost Automatic Test Equipment Compatibility.

Sachin Dileep Dasnurkar, Jacob A. Abraham

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009