S. Saqib Khursheed

According to our database, S. Saqib Khursheed authored at least 53 papers between 2006 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

PCB Hardware Trojan Run-Time Detection Through Machine Learning.

Gor Piliposyan, Saqib Khursheed

IEEE Trans. Computers, July, 2023

2022

Hardware Trojan Detection on a PCB Through Differential Power Monitoring.

Gor Piliposyan, Saqib Khursheed, Daniele Rossi

IEEE Trans. Emerg. Top. Comput., 2022

Online Remaining Useful Lifetime Prediction Using Support Vector Regression.

Antonio Leonel Hernández Martínez, Saqib Khursheed, Turki Alnuayri, Daniele Rossi

IEEE Trans. Emerg. Top. Comput., 2022

Operational Age Estimation of ICs using Gaussian Process Regression.

Anmol Singh Narwariya, Pabitra Das, Saqib Khursheed, Amit Acharyya

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Differential Aging Sensor Using Subthreshold Leakage Current to Detect Recycled ICs.

Turki Alnuayri, S. Saqib Khursheed, Antonio Leonel Hernández Martínez, Daniele Rossi

IEEE Trans. Very Large Scale Integr. Syst., 2021

IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs.

Srisubha Kalanadhabhatta, Rashi Dutt, S. Saqib Khursheed, Amit Acharyya

Proceedings of the IEEE International Symposium on Circuits and Systems, 2021

An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults.

Anuraag Narang, Balaji Venn, S. Saqib Khursheed, Peter Harrod

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

Differential Aging Sensor to Detect Recycled ICs using Sub-threshold Leakage Current.

Turki Alnuayri, S. Saqib Khursheed, Antonio Leonel Hernández Martínez, Daniele Rossi

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

A Cost-Aware Framework for Lifetime Reliability of TSV-Based 3D-IC Design.

Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed

IEEE Trans. Circuits Syst., 2020

LFSR generation for high test coverage and low hardware overhead.

Leonel Hernández Martínez, S. Saqib Khursheed, Sudhakar M. Reddy

IET Comput. Digit. Tech., 2020

Leveraging CMOS Aging for Efficient Microelectronics Design.

Antonio Leonel Hernández Martínez, S. Saqib Khursheed, Daniele Rossi

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

Secure Scan Design with a Novel Methodology of Scan Camouflaging.

Srisubha Kalanadhabhatta, Kiran Kumar Anumandla, S. Saqib Khursheed, Amit Acharyya

Proceedings of the European Conference on Circuit Theory and Design, 2020

2019

A Framework for TSV Based 3D-IC to Analyze Aging and TSV Thermo-Mechanical Stress on Soft Errors.

Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed

Proceedings of the IEEE International Test Conference in Asia, 2019

Fault Tolerance in 3D-ICs.

Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed

Proceedings of the Security and Fault Tolerance in Internet of Things, 2019

2018

Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs.

Vasileios Tenentes, Daniele Rossi, S. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Recycled IC detection through aging sensor.

Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Sudhakar M. Reddy

Proceedings of the 23rd IEEE European Test Symposium, 2018

2017

Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure.

Vasileios Tenentes, Daniele Rossi, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, Steve R. Gunn

IEEE Trans. Very Large Scale Integr. Syst., 2017

A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs.

Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed

IEEE Trans. Very Large Scale Integr. Syst., 2017

Aging Benefits in Nanometer CMOS Designs.

Daniele Rossi, Vasileios Tenentes, Sheng Yang, Syed Saqib Khursheed, Bashir M. Al-Hashimi

IEEE Trans. Circuits Syst. II Express Briefs, 2017

Improved Wire Length-Driven Placement Technique for Minimizing Wire Length, Area and Timing.

Srinivas Sabbavarapu, Basireddy Karunakar Reddy, Amit Acharyya, S. Saqib Khursheed

J. Low Power Electron., 2017

Welcome Message.

Rishad A. Shafik, Qiaoyan Yu, S. Saqib Khursheed, Antonio Miele

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017

2016

Reliable Power Gating With NBTI Aging Benefits.

Daniele Rossi, Vasileios Tenentes, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi

IEEE Trans. Very Large Scale Integr. Syst., 2016

Guest Editors' Introduction: Robust 3-D Stacked ICs.

S. Saqib Khursheed, Pascal Vivet, Fabian Hopsch, Erik Jan Marinissen

IEEE Des. Test, 2016

Co-optimization of fault tolerance, wirelength and temperature mitigation in TSV-based 3D ICs.

Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi, Zhiwen Zhao

Proceedings of the 2016 IFIP/IEEE International Conference on Very Large Scale Integration, 2016

Reconfigurable hardware-software codesign methodology for protein identification.

Venkateshwarlu Y. Gudur, Sandeep Thallada, Abhinay R. Deevi, Venkata Krishna Gande, Amit Acharyya, Vasundhra Bhandari, Paresh Sharma, S. Saqib Khursheed, Ganesh R. Naik

Proceedings of the 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2016

2015

Online Fault Tolerance Technique for TSV-Based 3-D-IC.

Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi

IEEE Trans. Very Large Scale Integr. Syst., 2015

DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test.

Vasileios Tenentes, S. Saqib Khursheed, Daniele Rossi, Sheng Yang, Bashir M. Al-Hashimi

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Application-specific memory protection policies for energy-efficient reliable design.

Sheng Yang, Rishad A. Shafik, S. Saqib Khursheed, David Flynn, Geoff V. Merrett, Bashir M. Al-Hashimi

Proceedings of the 2015 International Symposium on Rapid System Prototyping, 2015

BTI and leakage aware dynamic voltage scaling for reliable low power cache memories.

Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

Diagnosis of power switches with power-distribution-network consideration.

Vasileios Tenentes, Daniele Rossi, S. Saqib Khursheed, Bashir M. Al-Hashimi

Proceedings of the 20th IEEE European Test Symposium, 2015

NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating.

Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi

Proceedings of the 20th IEEE European Test Symposium, 2015

2014

Delay Test for Diagnosis of Power Switches.

S. Saqib Khursheed, Kan Shi, Bashir M. Al-Hashimi, Peter R. Wilson, Krishnendu Chakrabarty

IEEE Trans. Very Large Scale Integr. Syst., 2014

Efficient Variation-Aware Delay Fault Simulation Methodology for Resistive Open and Bridge Defects.

Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi, Wei Zhao

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

High Quality Testing of Grid Style Power Gating.

Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi, Shida Zhong, Sheng Yang

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under PVT Variation.

Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, David Flynn, Geoff V. Merrett

IEEE Trans. Circuits Syst. I Regul. Pap., 2013

Impact of PVT variation on delay test of resistive open and resistive bridge defects.

Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2011

A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects.

Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery.

Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, David Flynn, Sachin Idgunji

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Improved DFT for Testing Power Switches.

S. Saqib Khursheed, Sheng Yang, Bashir M. Al-Hashimi, Xiaoyu Huang, David Flynn

Proceedings of the 16th European Test Symposium, 2011

Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation.

Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Krishnendu Chakrabarty

Proceedings of the 20th IEEE Asian Test Symposium, 2011

Cost-Effective TSV Grouping for Yield Improvement of 3D-ICs.

Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Test and diagnosis of resistive bridges in multi-Vdd designs.

Syed Saqib Khursheed

PhD thesis, 2010

Gate-Sizing-Based Single V_dd Test for Bridge Defects in Multivoltage Designs.

S. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty, Peter Harrod

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

Modeling the impact of process variation on resistive bridge defects.

S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, Sandip Kundu

Proceedings of the 2011 IEEE International Test Conference, 2010

Scan based methodology for reliable state retention power gating designs.

Sheng Yang, Bashir M. Al-Hashimi, David Flynn, S. Saqib Khursheed

Proceedings of the Design, Automation and Test in Europe, 2010

2009

Diagnosis of Multiple-Voltage Design With Bridge Defect.

S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

Process Variation-Aware Test for Resistive Bridges.

Urban Ingelsson, Bashir M. Al-Hashimi, S. Saqib Khursheed, Sudhakar M. Reddy, Peter Harrod

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing.

S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod

Proceedings of the Design, Automation and Test in Europe, 2009

2008

Bridging Fault Test Method With Adaptive Power Management Awareness.

S. Saqib Khursheed, Urban Ingelsson, Paul M. Rosinger, Bashir M. Al-Hashimi, Peter Harrod

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008

Bridge Defect Diagnosis for Multiple-Voltage Design.

S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod

Proceedings of the 13th European Test Symposium, 2008

2007

Efficient test compaction for combinational circuits based on Fault detection count-directed clustering.

Aiman El-Maleh, S. Saqib Khursheed

IET Comput. Digit. Tech., 2007

Resistive Bridging Faults DFT with Adaptive Power Management Awareness.

Urban Ingelsson, Paul M. Rosinger, S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod

Proceedings of the 16th Asian Test Symposium, 2007

2006

Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation.

Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006