S. R. Stein

According to our database, S. R. Stein authored at least 1 paper in 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Characterization of Interface Trap Density in SiC MOSFETs Subjected to High Voltage Gate Stress.

S. R. Stein, J. Kim, Suman Das, Daniel J. Lichtenwalner, Sei-Hyung Ryu

Proceedings of the IEEE International Reliability Physics Symposium, 2024