S. R. Stein

According to our database, S. R. Stein authored at least 1 paper in 2024.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2024

Characterization of Interface Trap Density in SiC MOSFETs Subjected to High Voltage Gate Stress.

S. R. Stein, J. Kim, S. Das, Daniel J. Lichtenwalner, S. Ryu

Proceedings of the IEEE International Reliability Physics Symposium, 2024