S. Ooshiro

According to our database, S. Ooshiro authored at least 2 papers in 2001.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2001

Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability.

Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Y. Tatsumi, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Terufumi Yamaguchi, Kyoji Yamashita, Noriaki Nakayama

Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, 2001

Correlation method of circuit-performance and technology fluctuations for improved design reliability.

D. Miyawaki, Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Masami Suetake, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama

Proceedings of ASP-DAC 2001, 2001