S. Gomri

According to our database, S. Gomri authored at least 1 paper in 2005.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2005

Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies.

Didier Goguenheim, Alain Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, Philippe Boivin

Microelectron. Reliab., 2005