S. E. Liu
According to our database1,
S. E. Liu
authored at least 3 papers
between 2015 and 2019.
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Bibliography
2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Fast chip aging prediction by product-like VMIN drift characterization on test structures.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2015
Thermal behavior of self-heating effect in FinFET devices acting on back-end interconnects.
Proceedings of the IEEE International Reliability Physics Symposium, 2015