S. C. Shin

According to our database, S. C. Shin authored at least 1 paper in 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2019

Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology.

Y. Ji, H. J. Goo, J. Lim, S. B. Lee, S. Lee, Taiki Uemura, J. C. Park, S. I. Han, S. C. Shin, J. H. Lee, Y. J. Song, K. M. Lee, H. M. Shin, S. H. Hwang, B. Y. Seo, Y. K. Lee, J. C. Kim, Gwanhyeob Koh, K. C. Park, Sangwoo Pae, Gi-Tae Jeong, J. S. Yoon, E. S. Jung

Proceedings of the IEEE International Reliability Physics Symposium, 2019