S. Bruyère
According to our database1,
S. Bruyère
authored at least 9 papers
between 2001 and 2005.
Collaborative distances:
Collaborative distances:
Timeline
2001
2002
2003
2004
2005
0
1
2
3
4
2
3
2
2
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2005
Evidence and modelling current dependence of defect generation probability and its impact on charge to breakdown.
Microelectron. Reliab., 2005
Multi-vibrational hydrogen release: Physical origin of T<sub>bd</sub>, Q<sub>bd</sub> power-law voltage dependence of oxide breakdown in ultra-thin gate oxides.
Microelectron. Reliab., 2005
2003
New insights into the change of voltage acceleration and temperature activation of oxide breakdown.
Microelectron. Reliab., 2003
Microelectron. Reliab., 2003
2002
Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement.
Microelectron. Reliab., 2002
2001
Determination of Dielectric Breakdown Weibull Distribution Parameters Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions.
Microelectron. Reliab., 2001
Microelectron. Reliab., 2001