S. Blonkowski

According to our database, S. Blonkowski authored at least 4 papers between 2003 and 2022.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2022

Frequency dependant gate oxide TDDB model.

M. Arabi, X. Federspiel, Florian Cacho, M. Rafik, S. Blonkowski, Xavier Garros, G. Guibaudo

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2013

Impact of bilayer character on High K gate stack dielectrics breakdown obtained by conductive atomic force microscopy.

R. Foissac, S. Blonkowski, M. Kogelschatz, P. Delcroix, M. Gros-Jean, F. Bassani

Microelectron. Reliab., 2013

2003

Electrical characterisation and reliability of HfO₂ and Al₂O₃-HfO₂ MIM capacitors.

F. Mondon, S. Blonkowski

Microelectron. Reliab., 2003

MIM capacitance variation under electrical stress.

C. Besset, S. Bruyère, S. Blonkowski, S. Crémer, E. Vincent

Microelectron. Reliab., 2003