S. Aurite

According to our database, S. Aurite authored at least 1 paper in 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2007

Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage.

Domenico Corso, S. Aurite, E. Sciacca, D. Naso, Salvatore Lombardo, A. Santangelo, M. C. Nicotra, S. Cascino

Microelectron. Reliab., 2007