Ryusuke Nebashi

According to our database, Ryusuke Nebashi authored at least 18 papers between 2007 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

28nm Atom-Switch FPGA: Static Timing Analysis and Evaluation.

Xu Bai, Ryusuke Nebashi, Makoto Miyamura, Kazunori Funahashi, Naoki Banno, Koichiro Okamoto, Hideaki Numata, Noriyuki Iguchi, Tadahiko Sugibayashi, Toshitsugu Sakamoto, Munehiro Tada

IEICE Trans. Electron., October, 2022

Via-Switch FPGA: 65-nm CMOS Implementation and Evaluation.

Xu Bai, Naoki Banno, Makoto Miyamura, Ryusuke Nebashi, Koichiro Okamoto, Hideaki Numata, Noriyuki Iguchi, Masanori Hashimoto, Tadahiko Sugibayashi, Toshitsugu Sakamoto, Munehiro Tada

IEEE J. Solid State Circuits, 2022

2020

ON-state retention of Atom Switch eNVM for IoT/AI Inference Solution.

Koichiro Okamoto, Ryusuke Nebashi, Naoki Banno, Xu Bai, Hideaki Numata, Noriyuki Iguchi, Makoto Miyamura, Hiromitsu Hada, Kazunori Funahashi, Tadahiko Sugibayashi, Toshitsugu Sakamoto, Munehiro Tada

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

A 171k-LUT Nonvolatile FPGA using Cu Atom-Switch Technology in 28nm CMOS.

Ryusuke Nebashi, Naoki Banno, Makoto Miyamura, Xu Bai, Kazunori Funahashi, Koichiro Okamoto, Noriyuki Iguchi, Hideaki Numata, Tadahiko Sugibayashi, Toshitsugu Sakamoto, Munehiro Tada

Proceedings of the 30th International Conference on Field-Programmable Logic and Applications, 2020

2017

NanoBridge-Based FPGA in High-Temperature Environments.

Makoto Miyamura, Toshitsugu Sakamoto, Xu Bai, Yukihide Tsuji, Ayuka Morioka, Ryusuke Nebashi, Munehiro Tada, Naoki Banno, Koichiro Okamoto, Noriyuki Iguchi, Hiromitsu Hada, Tadahiko Sugibayashi, Yuya Nagamatsu, Soichi Ookubo, Takuma Shirai, Fumihito Sugai, Masayuki Inaba

IEEE Micro, 2017

2016

Evaluation of Soft-Delay-Error Effects in Content-Addressable Memory.

Naoya Onizawa, Noboru Sakimura, Ryusuke Nebashi, Tadahiko Sugibayashi, Takahiro Hanyu

J. Multiple Valued Log. Soft Comput., 2016

A 2× logic density Programmable Logic array using atom switch fully implemented with logic transistors at 40nm-node and beyond.

Yukihide Tsuji, Xu Bai, Ayuka Morioka, Makoto Miyamura, Ryusuke Nebashi, Toshitsugu Sakamoto, Munehiro Tada, Naoki Banno, Koichiro Okamoto, Noriyuki Iguchi, Hiromitsu Hada, Tadahiko Sugibayashi

Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016

2015

Nonvolatile Logic-in-Memory LSI Using Cycle-Based Power Gating and its Application to Motion-Vector Prediction.

Masanori Natsui, Daisuke Suzuki, Noboru Sakimura, Ryusuke Nebashi, Yukihide Tsuji, Ayuka Morioka, Tadahiko Sugibayashi, Sadahiko Miura, Hiroaki Honjo, Keizo Kinoshita, Shoji Ikeda, Tetsuo Endoh, Hideo Ohno, Takahiro Hanyu

IEEE J. Solid State Circuits, 2015

2014

Complementary 5T-4MTJ nonvolatile TCAM cell circuit with phase-selective parallel writing scheme.

Shoun Matsunaga, Akira Mochizuki, Noboru Sakimura, Ryusuke Nebashi, Tadahiko Sugibayashi, Tetsuo Endoh, Hideo Ohno, Takahiro Hanyu

IEICE Electron. Express, 2014

10.5 A 90nm 20MHz fully nonvolatile microcontroller for standby-power-critical applications.

Noboru Sakimura, Yukihide Tsuji, Ryusuke Nebashi, Hiroaki Honjo, Ayuka Morioka, Kunihiko Ishihara, Keizo Kinoshita, Shunsuke Fukami, Sadahiko Miura, Naoki Kasai, Tetsuo Endoh, Hideo Ohno, Takahiro Hanyu, Tadahiko Sugibayashi

Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

Soft-Delay-Error Evaluation in Content-Addressable Memory.

Naoya Onizawa, Shoun Matsunaga, Noboru Sakimura, Ryusuke Nebashi, Tadahiko Sugibayashi, Takahiro Hanyu

Proceedings of the IEEE 44th International Symposium on Multiple-Valued Logic, 2014

A delay circuit with 4-terminal magnetic-random-access-memory device for power-efficient time- domain signal processing.

Ryusuke Nebashi, Noboru Sakimura, Hiroaki Honjo, Ayuka Morioka, Yukihide Tsuji, Kunihiko Ishihara, Keiichi Tokutome, Sadahiko Miura, Shunsuke Fukami, Keizo Kinoshita, Takahiro Hanyu, Tetsuo Endoh, Naoki Kasai, Hideo Ohno, Tadahiko Sugibayashi

Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014

2013

Nonvolatile logic-in-memory array processor in 90nm MTJ/MOS achieving 75% leakage reduction using cycle-based power gating.

Masanori Natsui, Daisuke Suzuki, Noboru Sakimura, Ryusuke Nebashi, Yukihide Tsuji, Ayuka Morioka, Tadahiko Sugibayashi, Sadahiko Miura, Hiroaki Honjo, Keizo Kinoshita, Shoji Ikeda, Tetsuo Endoh, Hideo Ohno, Takahiro Hanyu

Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013

2012

High-speed simulator including accurate MTJ models for spintronics integrated circuit design.

Noboru Sakimura, Ryusuke Nebashi, Yukihide Tsuji, Hiroaki Honjo, Tadahiko Sugibayashi, Hiroki Koike, Takashi Ohsawa, Shunsuke Fukami, Takahiro Hanyu, Hideo Ohno, Tetsuo Endoh

Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

2009

Nonvolatile Magnetic Flip-Flop for Standby-Power-Free SoCs.

Noboru Sakimura, Tadahiko Sugibayashi, Ryusuke Nebashi, Naoki Kasai

IEEE J. Solid State Circuits, 2009

Shared Write-Selection Transistor Cell and Leakage-Replication Read Scheme for Large Capacity MRAM Macros.

Ryusuke Nebashi, Noboru Sakimura, Tadahiko Sugibayashi, Naoki Kasai

IEICE Trans. Electron., 2009

A 90nm 12ns 32Mb 2T1MTJ MRAM.

Ryusuke Nebashi, Noboru Sakimura, Hiroaki Honjo, Shinsaku Saito, Yuichi Ito, Sadahiko Miura, Yuko Kato, Kaoru Mori, Yasuaki Ozaki, Yosuke Kobayashi, Norikazu Ohshima, Keizo Kinoshita, Tetsuhiro Suzuki, Kiyokazu Nagahara, Nobuyuki Ishiwata, Katsumi Suemitsu, Shunsuke Fukami, Hiromitsu Hada, Tadahiko Sugibayashi, Naoki Kasai

Proceedings of the IEEE International Solid-State Circuits Conference, 2009

2007

A 16-Mb Toggle MRAM With Burst Modes.

Tadahiko Sugibayashi, Noboru Sakimura, Takeshi Honda, Kiyokazu Nagahara, Kiyotaka Tsuji, Hideaki Numata, Sadahiko Miura, Ken-ichi Shimura, Yuko Kato, Shinsaku Saito, Yoshiyuki Fukumoto, Hiroaki Honjo, Tetsuhiro Suzuki, Katsumi Suemitsu, Tomonori Mukai, Kaoru Mori, Ryusuke Nebashi, Shunsuke Fukami, Norikazu Ohshima, Hiromitsu Hada, Nobuyuki Ishiwata, Naoki Kasai, Shuichi Tahara

IEEE J. Solid State Circuits, 2007