Ryuichi Nakajima
Orcid: 0000-0003-3121-4098
According to our database1,
Ryuichi Nakajima
authored at least 10 papers
between 2022 and 2024.
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Collaborative distances:
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Bibliography
2024
Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies.
IEICE Trans. Electron., 2024
Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy Ion and Neutron Irradiation.
IEICE Trans. Electron., 2024
IEICE Electron. Express, 2024
An Approach to Neutron-Induced SER Evaluation Using a Clinical 290 MeV/ u Carbon Beam and Particle Transport Simulations.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
A Partially-redundant Flip-flip Suitable for Mitigating Single Event Upsets in a FD-SOI Process with Low Performance Overhead.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Radiation Hardened Flip-Flops with low Area, Delay and Power Overheads in a 65 nm bulk process.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation.
Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023
SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by α-Particle Irradiation.
Proceedings of the International Conference on IC Design and Technology, 2023
Proceedings of the International Conference on IC Design and Technology, 2023
2022
Radiation Hardened Flip-Flops Minimizing Area, Power, and Delay Overheads with 1/100 Lower α-SER in a 130 nm Bulk Process.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022