Ryuichi Nakajima

According to our database, Ryuichi Nakajima authored at least 9 papers between 2022 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies.

Ryuichi Nakajima, Takafumi Ito, Shotaro Sugitani, Tomoya Kii, Mitsunori Ebara, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard

IEICE Trans. Electron., 2024

Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy Ion and Neutron Irradiation.

Jun Furuta, Shotaro Sugitani, Ryuichi Nakajima, Takafumi Ito, Kazutoshi Kobayashi

IEICE Trans. Electron., 2024

An Approach to Neutron-Induced SER Evaluation Using a Clinical 290 MeV/ u Carbon Beam and Particle Transport Simulations.

Ryuichi Nakajima, Shotaro Sugitani, Haruto Sugisaki, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Makoto Sakai

Proceedings of the IEEE International Reliability Physics Symposium, 2024

A Partially-redundant Flip-flip Suitable for Mitigating Single Event Upsets in a FD-SOI Process with Low Performance Overhead.

Jun Furuta, Shotaro Sugitani, Ryuichi Nakajima, Kazutoshi Kobayashi

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Radiation Hardened Flip-Flops with low Area, Delay and Power Overheads in a 65 nm bulk process.

Shotaro Sugitani, Ryuichi Nakajima, Keita Yoshida, Jun Furuta, Kazutoshi Kobayashi

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation.

Shotaro Sugitani, Ryuichi Nakajima, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by α-Particle Irradiation.

Keita Yoshida, Ryuichi Nakajima, Shotaro Sugitani, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi

Proceedings of the International Conference on IC Design and Technology, 2023

Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements.

Haruto Sugisaki, Ryuichi Nakajima, Shotaro Sugitani, Jun Furuta, Kazutoshi Kobayashi

Proceedings of the International Conference on IC Design and Technology, 2023

2022

Radiation Hardened Flip-Flops Minimizing Area, Power, and Delay Overheads with 1/100 Lower α-SER in a 130 nm Bulk Process.

Ryuichi Nakajima, Kazuya Ioki, Jun Furuta, Kazutoshi Kobayashi

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022