Ryo Kishida

According to our database, Ryo Kishida authored at least 16 papers between 2014 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

A Fractional-N PLL for Multi-phase Clock Generation with Loop Bandwidth Enhancement.

Reo Nagasue, Isamu Mizuno, Ryo Kishida, Tatsuya Iwata, Takefumi Yoshikawa

Proceedings of the IEEE International Symposium on Circuits and Systems, 2024

2023

Ring Oscillators with identical Circuit Structure to Measure Bias Temperature Instability.

Daisuke Kikuta, Ryo Kishida, Kazutoshi Kobayashi

Proceedings of the 15th IEEE International Conference on ASIC, 2023

2022

An Aging Degradation Suppression Scheme at Constant Performance by Controlling Supply Voltage and Body Bias in a 65 nm Fully-Depleted Silicon-On-Insulator Process.

Ikuo Suda, Ryo Kishida, Kazutoshi Kobayashi

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Digital Calibration Algorithm of Conversion Error Influenced by Parasitic Capacitance in C-C SAR-ADC Based on γ-Estimation.

Satoshi Sekine, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2021

Bias Temperature Instability Depending on Body Bias through Buried Oxide (BOX) Layer in a 65 nm Fully-Depleted Silicon-On-Insulator Process.

Ryo Kishida, Ikuo Suda, Kazutoshi Kobayashi

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement.

Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi

IPSJ Trans. Syst. LSI Des. Methodol., 2020

2019

Examination of Incremental ADC with SAR ADC to Reduce Conversion Time with High Accuracy.

Yuichiro Unno, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo

Proceedings of the 2019 International Symposium on Intelligent Signal Processing and Communication Systems, 2019

Duty Ratio and Capacitance Analysis of AC/DC Converter without Current Control Circuit.

Yuki Tanaka, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo

Proceedings of the 2019 International Symposium on Intelligent Signal Processing and Communication Systems, 2019

Investigation of Hybrid ADC Combined with First-order Feedforward Incremental and SAR ADCs.

Yuichiro Kobayashi, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo

Proceedings of the 2019 International Symposium on Intelligent Signal Processing and Communication Systems, 2019

Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement.

Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

Temperature Dependence of Bias Temperature Instability (BTI) in Long-term Measurement by BTI-sensitive and -insensitive Ring Oscillators Removing Environmental Fluctuation.

Takuya Asuke, Ryo Kishida, Jun Furuta, Kazutoshi Kobayashi

Proceedings of the 13th IEEE International Conference on ASIC, 2019

2018

A Novel C-2αC Ladder Based Non-binary DAC for SAR-ADC Using Unit Capacitors.

Satoshi Sekine, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo

Proceedings of the 2018 International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS), 2018

2017

Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS Model.

Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2017

Circuit-level simulation methodology for Random Telegraph Noise by using Verilog-AMS.

Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi

Proceedings of the 2017 IEEE International Conference on IC Design and Technology, 2017

2015

Negative bias temperature instability caused by plasma induced damage in 65 nm bulk and Silicon on thin BOX (SOTB) processes.

Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs.

Michitarou Yabuuchi, Ryo Kishida, Kazutoshi Kobayashi

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2014