Ryan H.-M. Huang

According to our database, Ryan H.-M. Huang authored at least 9 papers between 2013 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Coupling-Aware Functional Timing Analysis for Tighter Bounds: How Much Margin Can We Relax?

Jack S.-Y. Lin, Louis Y.-Z. Lin, Ryan H.-M. Huang, Charles H.-P. Wen

Proceedings of the on Great Lakes Symposium on VLSI 2017, 2017

2015

A Determinate Radiation Hardened Technique for Safety-Critical CMOS Designs.

Ryan H.-M. Huang, Dennis K.-H. Hsu, Charles H.-P. Wen

J. Electron. Test., 2015

TA-FTA: transition-aware functional timing analysis with a four-valued encoding.

Jasper C. C. Chang, Ryan H.-M. Huang, Louis Y.-Z. Lin, Charles H.-P. Wen

Proceedings of the 52nd Annual Design Automation Conference, 2015

2014

TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits.

Sung S.-Y. Hsueh, Ryan H.-M. Huang, Charles H.-P. Wen

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

CASTA: CUDA-Accelerated Static Timing Analysis for VLSI Designs.

Hunta H.-W. Wang, Louis Y.-Z. Lin, Ryan H.-M. Huang, Charles H.-P. Wen

Proceedings of the 43rd International Conference on Parallel Processing, 2014

Advanced Soft-Error-Rate (SER) Estimation with Striking-Time and Multi-Cycle Effects.

Ryan H.-M. Huang, Charles H.-P. Wen

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

Suppressing test inflation in shared-memory parallel Automatic Test Pattern Generation.

Jerry C. Y. Ku, Ryan H.-M. Huang, Louis Y.-Z. Lin, Charles H.-P. Wen

Proceedings of the 19th Asia and South Pacific Design Automation Conference, 2014

2013

CASSER: A Closed-Form Analysis Framework for Statistical Soft Error Rate.

Austin C.-C. Chang, Ryan H.-M. Huang, Charles H.-P. Wen

IEEE Trans. Very Large Scale Integr. Syst., 2013

Aging-aware statistical soft-error-rate analysis for nano-scaled CMOS designs.

Cosette Y. H. Lin, Ryan H.-M. Huang, Charles H.-P. Wen, Austin C.-C. Chang

Proceedings of the 2013 International Symposium on VLSI Design, Automation, and Test, 2013