Rupam Goswami

According to our database, Rupam Goswami authored at least 6 papers between 2016 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Fin core dimensionality and corner effect in dual core gate-all-around FinFET.

Prachuryya Subash Das, Deepjyoti Deb, Rupam Goswami, Santanu Sharma, Rajesh Saha

Microelectron. J., January, 2024

2022

Analysis on electrical parameters including temperature and interface trap charges in gate overlap Ge source step shape double gate TFET.

Rajesh Saha, Rupam Goswami, Deepak Kumar Panda

Microelectron. J., 2022

Impact on performance of dual stack hetero- gated dielectric modulated TFET biosensor due to Si_1-xGe_x pocket variation.

Ayush Mangla, Rajesh Saha, Rupam Goswami

Microelectron. J., 2022

Parametric investigation and trap sensitivity of <i>n-p-n</i> double gate TFETs.

Deepjyoti Deb, Rupam Goswami, Ratul Kr. Baruah, Kavindra Kandpal, Rajesh Saha

Comput. Electr. Eng., 2022

2019

Optimization of ferroelectric tunnel junction TFET in presence of temperature and its RF analysis.

Puja Ghosh, Rupam Goswami, Brinda Bhowmick

Microelectron. J., 2019

2016

Effect of scaling on noise in Circular Gate TFET and its application as a digital inverter.

Rupam Goswami, Brinda Bhowmick, Srimanta Baishya

Microelectron. J., 2016