Ruohui Chen

According to our database, Ruohui Chen authored at least 2 papers in 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Enhancing Semiconductor Chip Image Defect Classification Using Deep Learning and Segmented Defect Region Information.

Xiaoyan Zheng, Tong Sang, Ruohui Chen, Zeng Zeng

Proceedings of the IEEE International Conference on Cybernetics and Intelligent Systems, 2023

Wafer Map Defect Recognition and Accurate Localization Based on Defect Completion Algorithm.

Tong Sang, Dai Sun, Wei Zhao, Ruohui Chen, Zeng Zeng

Proceedings of the IEEE International Conference on Cybernetics and Intelligent Systems, 2023