Ruishi Han
According to our database1,
Ruishi Han
authored at least 2 papers
between 2018 and 2020.
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Bibliography
2020
Proceedings of the 38th IEEE VLSI Test Symposium, 2020
2018
Analysis of the Effects of Single Event Upsets (SEUs) on User Memory in FPGA Implemented Viterbi Decoders.
Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018