Ruifeng Guo

CoRR, 2021

FERNANDO: A Software Transient Fault Tolerance Approach for Embedded Systems Based on Redundant Multi-Threading.

[BibT_eX]

[DOI]

Haotian Wu

Yi Hu

IEEE Access, 2021

Diagnosis and Yield Learning.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference in Asia, 2021

2018

Data cleansing for energy-saving: a case of Cyber-Physical Machine Tools health monitoring system.

[BibT_eX]

[DOI]

Int. J. Prod. Res., 2018

Efficient Cell-Aware Defect Characterization for Multi-bit Cells.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference in Asia, 2018

Linking events-based communication mechanism in multi-agent systems.

[BibT_eX]

[DOI]

Proceedings of the 15th IEEE International Conference on Networking, Sensing and Control, 2018

A real-time system low power scheduling algorithm based on total bandwidth server.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on Information and Automation, 2018

Manufacture Assembly Fault Detection Method based on Deep Learning and Mixed Reality.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on Information and Automation, 2018

Research on the Management Model Based on 3D Visualization Service Platform.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on Information and Automation, 2018

Real-Time Circuit Breaker State Detection and Identification Method Based on Faster R-CNN.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on Information and Automation, 2018

2017

View frustum culling algorithm based on optimized scene management structure.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on Information and Automation, 2017

Research on scene management technology based on adaptive binary tree and scene graph.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on Information and Automation, 2017

A fault diagnosis method for information systems based on weighted fault diagnosis tree.

[BibT_eX]

[DOI]

Proceedings of the 19th IEEE International Conference on e-Health Networking, 2017

2016

A Dynamic Power Management Algorithm for Sporadic Tasks in Real-Time Embedded Systems.

[BibT_eX]

[DOI]

Proceedings of the 2016 IEEE Trustcom/BigDataSE/ISPA, 2016

2015

Diagnosis and Layout Aware (DLA) Scan Chain Stitching.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2015

2013

Improving the simulation efficiency in five-axis milling by using an advanced octree and an implicit formula of a generalized cutter.

[BibT_eX]

[DOI]

Hongliang Wang

J. Syst. Sci. Complex., 2013

Improve speed path identification with suspect path expressions.

[BibT_eX]

[DOI]

Proceedings of the 2013 International Symposium on VLSI Design, Automation, and Test, 2013

A tool path error estimate in computer numerical control for five-axis machining.

[BibT_eX]

[DOI]

Proceedings of the Ninth International Conference on Natural Computation, 2013

2012

Scan-Based Speed-Path Debug for a Microprocessor.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 2012

Material Removal Simulation of Multi-axis NC Milling Based on Spatial Partitioning Level of Detail Model.

[BibT_eX]

[DOI]

Proceedings of the 12th IEEE International Conference on Computer and Information Technology, 2012

2011

Accurate Modeling Method for Generalized Tool Swept Volume in 5-axis NC Machining Simulation.

[BibT_eX]

[DOI]

J. Softw., 2011

Research on tool swept volume in NC simulation.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Electronic and Mechanical Engineering and Information Technology, 2011

Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

2010

A Topology-Aware Relay Lookup Scheme for P2P VoIP System.

[BibT_eX]

[DOI]

Int. J. Commun. Netw. Syst. Sci., 2010

Scan based speed-path debug for a microprocessor.

[BibT_eX]

[DOI]

Proceedings of the 15th European Test Symposium, 2010

Diagnosis of Multiple Physical Defects Using Logic Fault Models.

[BibT_eX]

[DOI]

Proceedings of the 19th IEEE Asian Test Symposium, 2010

Emulating and diagnosing IR-drop by using dynamic SDF.

[BibT_eX]

[DOI]

Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010

2009

Enhancing the Success Rate of Primary Version While Guaranteeing Fault-Tolerant Capability for Real-Time Systems.

[BibT_eX]

[DOI]

Wanfu Ding

Proceedings of the 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, 2009

Speed-Path Debug Using At-Speed Scan Test Patterns.

[BibT_eX]

[DOI]

Kun-Han Tsai

Proceedings of the 14th IEEE European Test Symposium, 2009

Improving compressed test pattern generation for multiple scan chain failure diagnosis.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2009

An Effective RM-Based Scheduling Algorithm for Fault-Tolerant Real-Time Systems.

[BibT_eX]

[DOI]

Wanfu Ding

Proceedings of the 12th IEEE International Conference on Computational Science and Engineering, 2009

At-Speed Scan Test Method for the Timing Optimization and Calibration.

[BibT_eX]

[DOI]

Kun-Han Tsai

Proceedings of the Eighteentgh Asian Test Symposium, 2009

On Improving Diagnostic Test Generation for Scan Chain Failures.

[BibT_eX]

[DOI]

Proceedings of the Eighteentgh Asian Test Symposium, 2009

Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns.

[BibT_eX]

[DOI]

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

Survey of Scan Chain Diagnosis.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 2008

Detection and Diagnosis of Static Scan Cell Internal Defect.

[BibT_eX]

[DOI]

Proceedings of the 2008 IEEE International Test Conference, 2008

Design and Evaluation of Sectional Real-Time Scheduling Algorithms Based on System Load.

[BibT_eX]

[DOI]

Wanfu Ding

Proceedings of the 9th International Conference for Young Computer Scientists, 2008

Diagnose Multiple Stuck-at Scan Chain Faults.

[BibT_eX]

[DOI]

Yu Huang

Proceedings of the 13th European Test Symposium, 2008

A Robust Automated Scan Pattern Mismatch Debugger.

[BibT_eX]

[DOI]

Kun-Han Tsai

Proceedings of the 17th IEEE Asian Test Symposium, 2008

Enhancing Transition Fault Model for Delay Defect Diagnosis.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Using Scan-Dump Values to Improve Functional-Diagnosis Methodology.

[BibT_eX]

[DOI]

Vishnu C. Vimjam

M. Enamul Amyeen

Michael S. Hsiao

Kai Yang

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Diagnose compound scan chain and system logic defects.

[BibT_eX]

[DOI]

Proceedings of the 2007 IEEE International Test Conference, 2007

A complete test set to diagnose scan chain failures.

[BibT_eX]

[DOI]

Yu Huang

Proceedings of the 2007 IEEE International Test Conference, 2007

Fault Dictionary Based Scan Chain Failure Diagnosis.

[BibT_eX]

[DOI]

Yu Huang

Proceedings of the 16th Asian Test Symposium, 2007

2006

An algorithmic technique for diagnosis of faulty scan chains.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

2005

The Research on Real-Time Middleware for Open Architecture Controller.

[BibT_eX]

[DOI]

Proceedings of the 11th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA 2005), 2005

Enabling yield analysis with X-compact.

[BibT_eX]

[DOI]

Zoran Stanojevic

Subhasish Mitra

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

An Experimental Study of N-Detect Scan ATPG Patterns on a Processor.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

2003

PROPTEST: a property-based test generator for synchronous sequential circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003

Reverse-order-restoration-based static test compaction for synchronous sequential circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003

Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation.

[BibT_eX]

[DOI]

Xiaoming Yu

M. Enamul Amyeen

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

2001

On Improving Static Test Compaction for Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001

A technique for fault diagnosis of defects in scan chains.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

On Improving a Fault Simulation Based Test Generator for Synchronous Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

1999

Static test compaction for synchronous sequential circuits based on vector restoration.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

The effects of test compaction on fault diagnosis.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction.

[BibT_eX]

[DOI]

Proceedings of the 36th Conference on Design Automation, 1999

1998

Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration.

[BibT_eX]

[DOI]

Proceedings of the 1998 Design, 1998

On Speeding-Up Vector Restoration Based Static Compaction of Test Sequences for Sequential Circuits .

[BibT_eX]

[DOI]