Rui Wang

Orcid: 0000-0001-5958-2234

Affiliations:

National University of Singapore, Department of Industrial and Systems Engineering, Singapore

According to our database¹, Rui Wang authored at least 3 papers between 2018 and 2023.

Collaborative distances:

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2023

Similarity searching for fault diagnosis of defect patterns in wafer bin maps.

[BibT_eX]

[DOI]

Comput. Ind. Eng., November, 2023

2020

Defect pattern recognition on wafers using convolutional neural networks.

[BibT_eX]

[DOI]

Qual. Reliab. Eng. Int., 2020

2018

Clustering Subway Station Arrival Patterns Using Weighted Dynamic Time Warping.

[BibT_eX]

[DOI]

Proceedings of the 2018 IEEE International Conference on Industrial Engineering and Engineering Management, 2018