Ruey-Shing Tzeng

According to our database, Ruey-Shing Tzeng authored at least 4 papers between 2001 and 2003.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2003

Testing and Diagnosis Methodologies for Embedded Content Addressable Memories.

Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu

J. Electron. Test., 2003

2002

Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test.

Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu

J. Electron. Test., 2002

Testing and Diagnosing Embedded Content Addressable Memories.

Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2001

A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters.

Chih-Wea Wang, Ruey-Shing Tzeng, Chi-Feng Wu, Chih-Tsun Huang, Cheng-Wen Wu, Shi-Yu Huang, Shyh-Horng Lin, Hsin-Po Wang

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001