Rudolf Ullmann

According to our database, Rudolf Ullmann authored at least 7 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2023

Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip.

Giorgio Insinga, M. Battilana, M. Coppetta, N. Mautone, G. Carnevale, M. Giltrelli, Pierre Scaramuzza, Rudolf Ullmann

Proceedings of the IEEE European Test Symposium, 2023

2022

Recent Trends and Perspectives on Defect-Oriented Testing.

Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip.

Paolo Bernardi, Giorgio Insinga, G. Paganini, Riccardo Cantoro, P. Beer, M. Coppetta, N. Mautone, G. Carnevale, Pierre Scaramuzza, Rudolf Ullmann

Proceedings of the IEEE European Test Symposium, 2022

2021

Industrial best practice: cases of study by automotive chip- makers.

L. Degli Abbati, Rudolf Ullmann, G. Paganini, M. Coppetta, L. Zaia, Vincent Huard, O. Montfort, Riccardo Cantoro, Giorgio Insinga, F. Venini, P. Calao, Paolo Bernardi

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

2019

A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip.

A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, M. Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi

Proceedings of the 24th IEEE European Test Symposium, 2019

2017

Robustness in automotive electronics: An industrial overview of major concerns.

Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Sánchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2014

Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening.

Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase

Proceedings of the 2014 International Test Conference, 2014