Roya Dibaj

Orcid: 0000-0002-8255-9443

According to our database1, Roya Dibaj authored at least 2 papers between 2017 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2018
Gate Oxide Short Defect Model in FinFETs.
J. Electron. Test., 2018

2017
Comprehensive investigation of gate oxide short in FinFETs.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017


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