Roy Josef Jevnisek
Orcid: 0000-0003-0058-3085Affiliations:
- Samsung Israel R&D Center, Tel Aviv, Israel
According to our database1,
Roy Josef Jevnisek
authored at least 7 papers
between 2016 and 2021.
Collaborative distances:
Collaborative distances:
Timeline
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Online presence:
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on orcid.org
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on dl.acm.org
On csauthors.net:
Bibliography
2021
CoRR, 2021
Knowing When to Quit: Selective Cascaded Regression with Patch Attention for Real-Time Face Alignment.
Proceedings of the MM '21: ACM Multimedia Conference, Virtual Event, China, October 20, 2021
You Better Look Twice: a new perspective for designing accurate detectors with reduced computations.
Proceedings of the 32nd British Machine Vision Conference 2021, 2021
2018
Proceedings of the 2018 IEEE Conference on Computer Vision and Pattern Recognition, 2018
2017
Proceedings of the 2017 IEEE Conference on Computer Vision and Pattern Recognition, 2017
2016