Ron Press

According to our database, Ron Press authored at least 11 papers between 2003 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Short Paper: Bus-based Packetized Scan Architecture Trade-offs for Heterogeneous Multi-Core SoCs.

Hiroyuki Iwata, Mahmoud AbdAlwahab, Ron Press, Ohki Sugiura

Proceedings of the IEEE International Test Conference, 2024

2017

Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test.

Yoichi Maeda, Jun Matsushima, Ron Press

Proceedings of the 26th IEEE Asian Test Symposium, 2017

2016

ITC and the Future of Test - We've Won.

Ron Press, Li-C. Wang

IEEE Des. Test, 2016

2010

The ABCs of ITC.

Ron Press, Erik H. Volkerink

IEEE Des. Test Comput., 2010

2009

Scan Compression Implementation in Industrial Design - Case Study.

Dragon Hsu, Ron Press

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2006

The Demand and Practical Approach for 100x Test Compression.

Ron Press, Jay Jahangiri

Proceedings of the IFIP VLSI-SoC 2006, 2006

Mentor Graphics DFT to Navigate Nanometer Test Challenges.

Greg Aldrich, Ron Press, Takeo Kobayashi, Tatsuo Sakajiri

Proceedings of the 15th Asian Test Symposium, 2006

2005

Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study.

Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality.

Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press

Proceedings of the 2005 Design, 2005

Achieving High Test Quality with Reduced Pin Count Testing.

Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2003

High-Frequency, At-Speed Scan Testing.

Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli

IEEE Des. Test Comput., 2003