Roméo Kom Kammeugne
Orcid: 0000-0001-7801-5710
According to our database1,
Roméo Kom Kammeugne
authored at least 2 papers
between 2021 and 2022.
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Bibliography
2022
Ultra-fast CV methods (< 10µs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021