Román Mozuelos

According to our database1, Román Mozuelos authored at least 14 papers between 2001 and 2013.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2013
Behavioral model of folded and interpolated ADCs for test evaluation - Case study: Structural DfT method.
Microelectron. J., 2013

Implantable Sensor System for Remote Detection of a Restenosis Condition.
Proceedings of the Technological Innovation for the Internet of Things, 2013

2012
Behavioural Analysis of an Implantable Flow and Pressure Sensing Device.
Proceedings of the BIODEVICES 2012 - Proceedings of the International Conference on Biomedical Electronics and Devices, Vilamoura, Algarve, Portugal, 1, 2012

2011
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor.
J. Electron. Test., 2011

Design-for-Test method for high-speed ADCs: Behavioral description and optimization.
Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

2010
Test Based on Built-In Current Sensors for Mixed-Signal Circuits.
Proceedings of the Emerging Trends in Technological Innovation, 2010

Structural DfT Strategy for High-Speed ADCs.
Proceedings of the Emerging Trends in Technological Innovation, 2010

Test of embedded analog circuits based on a built-in current sensor.
Proceedings of the 15th European Test Symposium, 2010

2007
Structural DfT Approach on Folded ADCs.
Proceedings of the 14th IEEE International Conference on Electronics, 2007

2005
Test of a switched-capacitor ADC by a built-in charge sensor.
Microelectron. J., 2005

Fault Detection in Switched Current Circuits Using Built-in Transient Current Sensors.
J. Electron. Test., 2005

2002
Hard-to-Detect Faults by Dinamic Current Sensor in Analogue Circuits.
Proceedings of the 3rd Latin American Test Workshop, 2002

Built-In Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal Ics.
Proceedings of the 2002 Design, 2002

2001
On Line IC Test Course With Distance Access to Test Equipment.
Proceedings of the 2nd Latin American Test Workshop, 2001


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