Roman Barsky

According to our database, Roman Barsky authored at least 2 papers in 2004.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of three.

2004

Electromigration-dependent parametric yield estimation.

Roman Barsky, Israel A. Wagner

Proceedings of the 2004 11th IEEE International Conference on Electronics, 2004

Reliability and Yield: A Joint Defect-Oriented Approach.

Roman Barsky, Israel A. Wagner

Proceedings of the 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 2004