Romain Gwoziecki
According to our database1,
Romain Gwoziecki
authored at least 16 papers
between 2010 and 2023.
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Bibliography
2023
Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited).
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Study on the difference between ID(VG) and C(VG) pBTI shifts in GaN-on-Si E-mode MOSc-HEMT.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Reliable method for low field temperature dependent mobility extraction at Al2O3/GaN interface.
Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021
Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021
2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Microelectron. Reliab., 2018
2017
On the understanding of cathode related trapping effects in GaN-on-Si Schottky diodes.
Proceedings of the 47th European Solid-State Device Research Conference, 2017
2014
Ambient Light Organic Sensor in a Printed Complementary Organic TFT Technology on Flexible Plastic Foil.
IEEE Trans. Circuits Syst. I Regul. Pap., 2014
Proceedings of the 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2014
Printed OTFT complementary circuits and matrix for Smart Sensing Surfaces applications.
Proceedings of the 44th European Solid State Device Research Conference, 2014
2012
High performance printed N and P-type OTFTs for complementary circuits on plastic substrate.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012
2011
Fully printed organic CMOS technology on plastic substrates for digital and analog applications.
Proceedings of the IEEE International Solid-State Circuits Conference, 2011
2010
Microelectron. Reliab., 2010