Roger C. Goerl

According to our database, Roger C. Goerl authored at least 7 papers between 2017 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

PCoSA: A product error correction code for use in memory devices targeting space applications.

David C. C. Freitas, David F. M. Mota, Roger C. Goerl, César A. M. Marcon, Fabian Vargas, Jarbas A. N. Silveira, João Cesar M. Mota

Integr., 2020

Optimizing RISC-V ISA Usage by Sharing Coprocessors on MPSoC.

Pedro Lima, Caio Vieira, Jorge Reis, Alexandre Almeida, Jarbas Silveira, Roger C. Goerl, César A. M. Marcon

Proceedings of the IEEE Latin-American Test Symposium, 2020

Error Coverage, Reliability and Cost Analysis of Fault Tolerance Techniques for 32-bit Memories used on Space Missions.

David C. C. Freitas, David F. M. Mota, Daniel Simões, Clailton Lopes, Roger C. Goerl, César Augusto Missio Marcon, Jarbas A. N. Silveira, João Cesar M. Mota

Proceedings of the 21st International Symposium on Quality Electronic Design, 2020

2019

Fault Tolerant Soft-Core Processor Architecture Based on Temporal Redundancy.

Paulo Ricardo Cechelero Villa, Rodrigo Travessini, Roger C. Goerl, Fabian Luis Vargas, Eduardo Augusto Bezerra

J. Electron. Test., 2019

A New Approach to Guarantee Critical Task Schedulability in TDMA-Based Bus Access of Multicore Architecture.

Estevan Lara, Guilherme Debon, Roger C. Goerl, Paulo Ricardo Cechelero Villa, Dorian Schramm, Leticia B. Poehls, Fabian Vargas

Proceedings of the IEEE Latin American Test Symposium, 2019

2018

An efficient EDAC approach for handling multiple bit upsets in memory array.

Roger C. Goerl, Paulo Ricardo Cechelero Villa, Letícia Maria Veiras Bolzani, Eduardo Augusto Bezerra, Fabian Luis Vargas

Microelectron. Reliab., 2018

2017

Analysis of single-event upsets in a Microsemi ProAsic3E FPGA.

Paulo Ricardo Cechelero Villa, Roger C. Goerl, Fabian Vargas, Leticia B. Poehls, Nilberto H. Medina, Nemitala Added, Vitor A. P. de Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei Aparecida Guazzelli da Silveira, Eduardo Augusto Bezerra

Proceedings of the 18th IEEE Latin American Test Symposium, 2017