Roel Gronheid

According to our database, Roel Gronheid authored at least 3 papers between 2008 and 2012.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2012

Trades-off between lithography line edge roughness and error-correcting codes requirements for NAND Flash memories.

Pavel Poliakov, Pieter Blomme, Alessandro Vaglio Pret, Miguel Corbalan Miranda, Roel Gronheid, Diederik Verkest, Jan Van Houdt, Wim Dehaene

Microelectron. Reliab., 2012

2009

Lithography Options for the 32 nm Half Pitch Node and Beyond.

Kurt Ronse, Philippe Jansen, Roel Gronheid, Eric Hendrickx, Mireille Maenhoudt, Vincent Wiaux, Mieke Goethals, R. Jonckheere, Geert Vandenberghe

IEEE Trans. Circuits Syst. I Regul. Pap., 2009

2008

Lithography options for the 32nm half pitch node and beyond.

Kurt Ronse, Philippe Jansen, Roel Gronheid, Eric Hendrickx, Mireille Maenhoudt, Mieke Goethals, Geert Vandenberghe

Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008