Rodolfo A. Rodriguez-Davila

According to our database, Rodolfo A. Rodriguez-Davila authored at least 4 papers between 2018 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation.

Rodolfo A. Rodriguez-Davila, L. Fernandez-Izquierdo, J. Fink, T. Moise, Robert C. Baumann, B. Gnade, Manuel Quevedo-Lopez, Chadwin D. Young

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2020

Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3.

Rodolfo A. Rodriguez-Davila, Richard A. Chapman, Massimo Catalano, Manuel Quevedo-Lopez, Chadwin D. Young

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric.

Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Manuel Quevedo-Lopez, Chadwin D. Young

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Electrical characterization of process induced effects on non-silicon devices.

Chadwin D. Young, Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Peng Zhao, Ava Khosravi, Israel Mejia, Manuel Quevedo-Lopez, Christopher L. Hinkle, Robert M. Wallace

Proceedings of the 2018 International Conference on IC Design & Technology, 2018