Roberto Gómez

Orcid: 0000-0003-4303-8036

Affiliations:
  • University of Sonora, Hermosillo Sonora, Mexico
  • University of Balearic Islands, Spain (former)
  • National Institute for Astrophysics Optics and Electronics, Puebla, Mexico (PhD 2007)


According to our database1, Roberto Gómez authored at least 11 papers between 2005 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

Online presence:

On csauthors.net:

Bibliography

2024
Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations.
J. Electron. Test., February, 2024

2020
Identification of Logic Paths Influenced by Severe Coupling Capacitances.
J. Electron. Test., 2020

2018
A metric-guided gate-sizing methodology for aging guardband reduction.
Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

2015
Repulsive Function in Potential Field Based Control with Algorithm for Safer Avoidance.
J. Intell. Robotic Syst., 2015

Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell.
Proceedings of the 16th Latin-American Test Symposium, 2015

2014
An Approach for Optimal Goal Position Assignment in Vehicle Formations.
J. Intell. Robotic Syst., 2014

2013
Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths.
IEEE Des. Test, 2013

2012
Testing of Stuck-Open Faults in Nanometer Technologies.
IEEE Des. Test Comput., 2012

2009
A modern look at the CMOS stuck-open fault.
Proceedings of the 10th Latin American Test Workshop, 2009

2008
A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines.
J. Electron. Test., 2008

2005
Test of Interconnection Opens Considering Coupling Signals.
Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005


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