Roberto Gómez

According to our database, Roberto Gómez authored at least 11 papers between 2005 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations.

Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura

J. Electron. Test., February, 2024

2020

Identification of Logic Paths Influenced by Severe Coupling Capacitances.

Ivan D. Meza-Ibarra, Víctor H. Champac, Roberto Gómez-Fuentes, Jose R. Noriega-Luna, A. Vera-Marquina

J. Electron. Test., 2020

2018

A metric-guided gate-sizing methodology for aging guardband reduction.

Andres F. Gomez, Roberto Gómez, Víctor H. Champac

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

2015

Repulsive Function in Potential Field Based Control with Algorithm for Safer Avoidance.

Luis García-Delgado, Jose R. Noriega-Luna, D. Berman-Mendoza, Ana Lilia Leal-Cruz, A. Vera-Marquina, Roberto Gómez-Fuentes, Alejandro García-Juárez, A. G. Rojas-Hernández, Ignacio E. Zaldívar-Huerta

J. Intell. Robotic Syst., 2015

Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell.

Hector Villacorta, Roberto Gómez, Sebastià A. Bota, Jaume Segura, Víctor H. Champac

Proceedings of the 16th Latin-American Test Symposium, 2015

2014

An Approach for Optimal Goal Position Assignment in Vehicle Formations.

Luis García-Delgado, Roberto Gómez-Fuentes, Alejandro García-Juárez, Ana Lilia Leal-Cruz, D. Berman-Mendoza, A. Vera-Marquina, A. G. Rojas-Hernández

J. Intell. Robotic Syst., 2014

2013

Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths.

Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura, Roberto Gómez

IEEE Des. Test, 2013

2012

Testing of Stuck-Open Faults in Nanometer Technologies.

Víctor H. Champac, Julio Vazquez Hernandez, Salvador Barceló, Roberto Gómez, Chuck Hawkins, Jaume Segura

IEEE Des. Test Comput., 2012

2009

A modern look at the CMOS stuck-open fault.

Roberto Gómez, Víctor H. Champac, Chuck Hawkins, Jaume Segura

Proceedings of the 10th Latin American Test Workshop, 2009

2008

A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines.

Roberto Gómez, Alejandro Girón, Víctor H. Champac

J. Electron. Test., 2008

2005

Test of Interconnection Opens Considering Coupling Signals.

Roberto Gómez, Alejandro Girón, Víctor H. Champac

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005