Robert W. Atherton

According to our database, Robert W. Atherton authored at least 8 papers between 1983 and 1990.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1990

Detailed simulation for semiconductor manufacturing.

Robert W. Atherton, Linda F. Atherton, Mark Pool

Proceedings of the 22th Winter Simulation Conference, 1990

1987

A Model for Wafer Fabrication Dynamics in Integrated Circuit Manufacturing.

Judith E. Dayhoff, Robert W. Atherton

IEEE Trans. Syst. Man Cybern., 1987

1986

Financial Impact of Tester Reliability Improvements.

Judith E. Dayhoff, Robert W. Atherton

Proceedings of the Proceedings International Test Conference 1986, 1986

1985

Financial Implications of a Detailed Analysis of Test Floor Operations.

Judith E. Dayhoff, Robert W. Atherton

Proceedings of the Proceedings International Test Conference 1985, 1985

Microprocessor Speed Optimization Using Pattern-Recognition Analysis of Parametric Test Data.

Robert W. Atherton, John L. Mudge

Proceedings of the Proceedings International Test Conference 1985, 1985

1984

Logic Device Characterization Using Computer-Aided Test and Analysis.

Robert W. Atherton, Leonard Ekkelkamp, Chuck Schmitz

Proceedings of the Proceedings International Test Conference 1984, 1984

1983

Operations Management and Analysis in the Management of Electronic Testing.

Robert W. Atherton, Alfred H. Miller Jr., Judith E. Dayhoff

Proceedings of the Proceedings International Test Conference 1983, 1983

Use of In-Fab Parametric Testing for Process Control of Semiconductor Manufacturing.

Robert W. Atherton, David M. Campbell

Proceedings of the Proceedings International Test Conference 1983, 1983