Robert Van Rijsinge

According to our database, Robert Van Rijsinge authored at least 4 papers between 1990 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

IoT: Source of test challenges.

Erik Jan Marinissen, Yervant Zorian, Mario Konijnenburg, Chih-Tsun Huang, Ping-Hsuan Hsieh, Peter Cockburn, Jeroen Delvaux, Vladimir Rozic, Bohan Yang, Dave Singelée, Ingrid Verbauwhede, Cedric Mayor, Robert Van Rijsinge, Cocoy Reyes

Proceedings of the 21th IEEE European Test Symposium, 2016

2007

A Design-Based Structural Test Method for a Switched-Resistor DAC.

Lei Ma, Geert Seuren, Robert Van Rijsinge, Corné Bastiaansen, Leon van der Dussen

J. Electron. Test., 2007

2004

Trends in Testing Integrated Circuits.

Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

1990

From specification to measurement: the bottleneck in analog industrial testing.

Robert Van Rijsinge, A. A. R. M. Haggenburg, C. de Vries, Hans Wallinga

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990