Robert Mroczynski

Orcid: 0000-0002-7067-6247

According to our database¹, Robert Mroczynski authored at least 2 papers between 2011 and 2012.

Collaborative distances:

Dijkstra number² of six.
Erdős number³ of six.

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2012

Reliability issues of double gate dielectric stacks based on hafnium dioxide (HfO<sub>2</sub>) layers for non-volatile semiconductor memory (NVSM) applications.

[BibT_eX]

[DOI]

Robert Mroczynski

Romuald B. Beck

Microelectron. Reliab., 2012

2011

Improvement of immunity on MeV electron radiation of MOS structures by means of ultra-shallow fluorine implantation.

[BibT_eX]

[DOI]

Malgorzata Kalisz

Robert Mroczynski

Romuald B. Beck

Microelectron. Reliab., 2011

Robert Mroczynski

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