Robert Limas Sierra

Orcid: 0000-0001-5206-3757

According to our database1, Robert Limas Sierra authored at least 13 papers between 2022 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs.
J. Electron. Test., April, 2024

Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations.
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024


Reliability Assessment of Large DNN Models: Trading Off Performance and Accuracy.
Proceedings of the 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024

Effective Application-level Error Modeling of Permanent Faults on AI Accelerators.
Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024

Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations.
Proceedings of the IEEE European Test Symposium, 2024

2023
Analyzing the Impact of Different Real Number Formats on the Structural Reliability of TCUs in GPUs.
Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023

Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs.
Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Evaluating the Prevalence of SFUs in the Reliability of GPUs.
Proceedings of the IEEE European Test Symposium, 2023

A Reliability-aware Environment for Design Exploration for GPU Devices.
Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023

2022
Evaluating the impact of Permanent Faults in a GPU running a Deep Neural Network.
Proceedings of the IEEE International Test Conference in Asia, 2022

Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections.
Proceedings of the 31st IEEE International Symposium on Industrial Electronics, 2022

Effective fault simulation of GPU's permanent faults for reliability estimation of CNNs.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022


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