Robert Kaplar
Orcid: 0000-0002-7928-9104
According to our database1,
Robert Kaplar
authored at least 4 papers
between 2020 and 2022.
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Bibliography
2022
Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress.
Proceedings of the Device Research Conference, 2022
2021
Study on Avalanche Uniformity in 1.2KV GaN Vertical PIN Diode with Bevel Edge-Termination.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2020
Non-Isothermal Simulations to Optimize SiC MOSFETs for Enhanced Short-Circuit Ruggedness.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020