Robert Jérisian

According to our database, Robert Jérisian authored at least 4 papers between 2001 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2004

Comparative study of thermal cycling and thermal shocks tests on electronic components reliability.

Stéphane Moreau, Thierry Lequeu, Robert Jérisian

Microelectron. Reliab., 2004

2003

Degradation mechanism of power devices under di/dt thermal shocks: turn-on of a TRIAC in Q3.

Stéphane Forster, Thierry Lequeu, Robert Jérisian

Microelectron. Reliab., 2003

2002

Influence of the turn-on mechanism on TRIACs' reliability: di/dt thermal fatigue study in Q1 compared to Q2.

Stéphane Moreau, Stéphane Forster, Thierry Lequeu, Robert Jérisian

Microelectron. Reliab., 2002

2001

Operation of power semiconductors under transient thermal conditions: thermal fatigue reliability and mechanical aspects.

Stéphane Forster, Thierry Lequeu, Robert Jérisian

Microelectron. Reliab., 2001