Robert C. Baumann

According to our database, Robert C. Baumann authored at least 4 papers between 2001 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2024

Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation.

Rodolfo A. Rodriguez-Davila, L. Fernandez-Izquierdo, J. Fink, T. Moise, Robert C. Baumann, B. Gnade, Manuel Quevedo-Lopez, Chadwin D. Young

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2020

Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications.

Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech

Proceedings of the IEEE European Test Symposium, 2020

An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices.

Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fermando Santos, Gabriel Piscoya Dávila, Philippe Olivier Alexandre Navaux, Stephen Wender, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech

Proceedings of the 50th Annual IEEE-IFIP International Conference on Dependable Systems and Networks, 2020

2001

Neutron-induced ¹⁰B fission as a major source of soft errors in high density SRAMs.

Robert C. Baumann, Eric B. Smith

Microelectron. Reliab., 2001