Rimon Ikeno

According to our database, Rimon Ikeno authored at least 14 papers between 1998 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Analysis of Light Intensity and Charge Holding Time Dependence of Pinned Photodiode Full Well Capacity.

Ken Miyauchi, Toshiyuki Isozaki, Rimon Ikeno, Junichi Nakamura

Sensors, October, 2023

A 3.96μm, 124dB Dynamic Range, 6.2mW Stacked Digital Pixel Sensor with Monochrome and Near-Infrared Dual-Channel Global Shutter Capture.

Song Chen, Chiao Liu, Lyle Bainbridge, Qing Chao, Ramakrishna Chilukuri, Wei Gao, Andrew P. Hammond, Tsung-Hsun Tsai, Ken Miyauchi, Isao Takayanagi, Masato Nagamatsu, Hirofumi Abe, Kazuya Mori, Masayuki Uno, Toshiyuki Isozaki, Rimon Ikeno, Hsin-Li Chen, Chih-Hao Lin, Wen-Chien Fu, Shou-Gwo Wuu

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2018

Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment.

Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada

J. Electron. Test., 2018

A Consideration on LUT Linearization of Stochastic ADC in Sub-Ranging Architecture.

Parit Kanjanavirojkul, Nguyen Ngoc Mai Khanh, Rimon Ikeno, Takahiro J. Yamaguchi, Tetsuya Iizuka, Kunihiro Asada

Proceedings of the IEEE 61st International Midwest Symposium on Circuits and Systems, 2018

2017

Extension of power supply impedance emulation method on ATE for multiple power domain.

Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada

Proceedings of the 22nd IEEE European Test Symposium, 2017

2016

Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board.

Toru Nakura, Naoki Terao, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada

Proceedings of the 2016 IEEE International Test Conference, 2016

Experimental demonstration of stochastic comparators for fine resolution ADC without calibration.

Nguyen Ngoc Mai Khanh, Rimon Ikeno, Takahiro J. Yamaguchi, Tetsuya Iizuka, Kunihiro Asada

Proceedings of the 2016 IEEE International Conference on Electronics, Circuits and Systems, 2016

2015

A Technique for Analyzing On-Chip Power Supply Impedance.

Masahiro Ishida, Toru Nakura, Akira Matsukawa, Rimon Ikeno, Kunihiro Asada

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014

A Structured Routing Architecture for Practical Application of Character Projection Method in Electron-Beam Direct Writing.

Rimon Ikeno, Takashi Maruyama, Satoshi Komatsu, Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2014

2013

High-Throughput Electron Beam Direct Writing of VIA Layers by Character Projection with One-Dimensional VIA Characters.

Rimon Ikeno, Takashi Maruyama, Satoshi Komatsu, Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2013

A structured routing architecture and its design methodology suitable for high-throughput electron beam direct writing with character projection.

Rimon Ikeno, Takashi Maruyama, Satoshi Komatsu, Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada

Proceedings of the International Symposium on Physical Design, 2013

High-throughput electron beam direct writing of VIA layers by character projection using character sets based on one-dimensional VIA arrays with area-efficient stencil design.

Rimon Ikeno, Takashi Maruyama, Tetsuya Iizuka, Satoshi Komatsu, Makoto Ikeda, Kunihiro Asada

Proceedings of the 18th Asia and South Pacific Design Automation Conference, 2013

2011

COOL interconnect low power interconnection technology for scalable 3D LSI design.

Marco Chacin, Hiroyuki Uchida, Michiya Hagimoto, Takashi Miyazaki, Takeshi Ohkawa, Rimon Ikeno, Yukoh Matsumoto, Fumito Imura, Motohiro Suzuki, Katsuya Kikuchi, Hiroshi Nakagawa, Masahiro Aoyagi

Proceedings of the 2011 IEEE Symposium on Low-Power and High-Speed Chips, 2011

1998

One-Dimensional Analysis of Subthreshold Characteristics of SOI-MOSFET Considering Quantum Mechanical Effects.

Rimon Ikeno, Hiroshi Ito, Kunihiro Asada

VLSI Design, 1998