Richard Schalek

According to our database, Richard Schalek authored at least 6 papers between 2010 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Two-stage error detection to improve electron microscopy image mosaicking.

Jiahao Shi, Hongyu Ge, Shuohong Wang, Donglai Wei, Jiancheng Yang, Ao Cheng, Richard Schalek, Jun Guo, Jeff Lichtman, Lirong Wang, Ruobing Zhang

Comput. Biol. Medicine, 2024

2023

High-Throughput Microscopy Image Deblurring with Graph Reasoning Attention Network.

Yulun Zhang, Donglai Wei, Richard Schalek, Yuelong Wu, Stephen G. Turney, Jeff Lichtman, Hanspeter Pfister, Yun Fu

Proceedings of the 20th IEEE International Symposium on Biomedical Imaging, 2023

2020

Learning Guided Electron Microscopy with Active Acquisition.

Lu Mi, Hao Wang, Yaron Meirovitch, Richard Schalek, Srinivas C. Turaga, Jeff W. Lichtman, Aravinthan D. T. Samuel, Nir Shavit

Proceedings of the Medical Image Computing and Computer Assisted Intervention - MICCAI 2020, 2020

Two Stream Active Query Suggestion for Active Learning in Connectomics.

Zudi Lin, Donglai Wei, Won-Dong Jang, Siyan Zhou, Xupeng Chen, Xueying Wang, Richard Schalek, Daniel R. Berger, Brian Matejek, Lee Kamentsky, Adi Suissa-Peleg, Daniel Haehn, Thouis R. Jones, Toufiq Parag, Jeff Lichtman, Hanspeter Pfister

Proceedings of the Computer Vision - ECCV 2020, 2020

2017

Scalable Interactive Visualization for Connectomics.

Daniel Haehn, John Hoffer, Brian Matejek, Adi Suissa-Peleg, Ali K. Al-Awami, Lee Kamentsky, Felix Gonda, Eagon Meng, William Zhang, Richard Schalek, Alyssa Wilson, Toufiq Parag, Johanna Beyer, Verena Kaynig, Thouis R. Jones, James Tompkin, Markus Hadwiger, Jeff W. Lichtman, Hanspeter Pfister

Informatics, 2017

2010

Boundary Learning by Optimization with Topological Constraints.

Viren Jain, Benjamin Bollmann, Mark Richardson, Daniel R. Berger, Moritz Helmstaedter, Kevin L. Briggman, Winfried Denk, Jared B. Bowden, John M. Mendenhall, Wickliffe C. Abraham, Kristen M. Harris, Narayanan Kasthuri, Ken J. Hayworth, Richard Schalek, Juan Carlos Tapia, Jeff W. Lichtman, H. Sebastian Seung

Proceedings of the Twenty-Third IEEE Conference on Computer Vision and Pattern Recognition, 2010